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| Manufacturer | THERMOFISHER |
|---|---|
| Model | Quanta200 FEG-ESEM |
| Year | 2007 |
| Location | Luxembourg
|
THERMOFISHER Quanta200 FEG-ESEM (manufactured 2007)
Overview
The Quanta 200 FEG-ESEM is a field-emission scanning electron microscope with environmental SEM capability designed for structural analysis and automated tasks across a wide range of sample types, including non-conductive, hydrated, biological, or contaminated specimens without extensive preparation. The system supports high vacuum, low vacuum and environmental SEM modes and includes a field emission gun (FEG).
Key instrument specifications (as supplied)
- Field emission gun (FEG)
- Operating voltage: 0.5–30 kV
- Spatial resolution: 15 kV: 2.1 nm; 1 kV: 5 nm
- Probe current: <100 nA
- Vacuum/ESEM ranges cited in supplied information for HV, LV and ESEM operation
Included detectors and analysis
- Secondary Electron (SE) detector
- Backscattered Electron (BSE) detector
- Energy Dispersive X-ray Spectroscopy (EDS/EDX): GENESIS XM 4i with Si(Li) type detector (EDAX) and a 10-litre liquid nitrogen dewar
Chambers, stages and sample handling
- Large specimen chamber with motorized stage
- Peltier stage (-20 °C to +100 °C)
- High-temperature heating stage (1500 °C)
Accessories, controls and support equipment
- Two computers driving three display screens
- Control table with keyboard, mouse and a multi-knob control pendant
- Power transformer
- Pumping system as supplied (turbo molecular pumps x2 and a rotary pump for the main chamber; ionic pumps x2 for the electron column)
- CD-ROMs (FEI & EDAX) and user manuals
Maintenance and availability
- Preventive maintenance reportedly carried out annually by FEI service engineers
- FEG tip replacement reported in April 2026
- System listed as available in September 2026
Condition and visible items
- EDAX EDS detector canister is mounted to the column
- Dual monitor workstation is present; screens display spectral and SEM image windows
- Control pendant with multiple knobs, keyboard and mouse are included at the operator desk
- Multiple computer towers and electronics are present under the desk and adjacent to the cabinet; extensive cabling is routed to the rear and floor (cable routing appears congested)
- Large instrument cabinet shows a green illuminated indicator light; exterior exhibits minor scuffs but no obvious major damage
- Monitors and control electronics appear powered on
Notes and limitations
All technical details and accessory lists above are taken from the supplied equipment description and the listed visual items. No claims are made regarding operational testing, current performance, or warranty unless explicitly provided in the supplied information.
The following description has been generated using artificial intelligence based on the product information available. It is provided for guidance only and may not reflect all specifications or conditions. Please contact us if you need precise or confirmed details.
The Quanta 200 FEG is a field-emission scanning electron microscope capable of acquiring all available information from any type of sample. It is a true "all-in-one" instrument, particularly well-suited for structural analysis and task automation. This represents the second generation of Quanta FEG systems, featuring improved image resolution and contrast, as well as an optional new imaging system that can be operated remotely
It is supplied with a field emission gun, it is capable to operate in both high vacuum (HV ; (P<6.10-4 Pa)) and low vacuum (LV ; P = 10 to 130 Pa) conditions as well as environmental SEM (ESEM ; P = 10 to 2700 Pa with water vapour).
ESEM capability allows imaging of non-conductive, hydrated, biological, or contaminated samples without extensive preparation.
Instrument characteristics:
• Field emission gun
• Spatial Resolution: 15 kV: 2.1 nm, 1 kV: 5 nm
• Operating voltage: 0.5-30 kV
• Probe current: < 100 nA
The instrument is equipped with:
• Secondary Electron (SE) detector
• Backscattered Electron (BSE) detector
• Energy Dispersive X-ray Spectroscopy (EDS/EDX) system for elemental analysis (GENESIS XM 4i with Si(Li) type detector (Super Ultra Thin Window) from EDAX and 10 litres liquid nitrogen dewar
• Large specimen chamber and motorized stage
• Peltier stage (-20°C - +100°C)
• Heating stage (1500°C)
Also included
• 2 Computers – 3 screens
• Power transformer
• Control table
• Pumping system (Turbo molecular pumps (x2) and rotary pump in the main chamber + ionic pumps (x2) for the electrons column)
• Cd Rom (FEI & EDAX)
• User Manuals
A preventive maintenance was annually carried out by FEI service engineers.
The FEG tip was replaced in April 2026.
System available in September 2026.
Please note that this description may have been translated or optimized with artificial intelligence (AI) automatically. The information of this classified ad are only indicative. We recommend to check the details with the seller before a purchase.
Is installation, services, or warranties included with this equipment?
This equipment has no installation, services, or warranties included.
What type of instrument is this FEI Quanta 200FEG-ESEM?
This FEI Quanta 200FEG-ESEM is a scanning electron microscope.
When was this FEI Quanta 200FEG-ESEM manufactured?
This FEI Quanta 200FEG-ESEM was manufactured in 2007.
The following questions and answers are generated using artificial intelligence based on the product information available. They are provided for guidance only and may not reflect all specifications or conditions. Please contact us if you need precise or confirmed details.
| Client type | Factory – large company |
| Active since | 2026 |
| Offers online | 1 |
| Last activity | Sept. 4, 2026 |
The Quanta 200 FEG is a field-emission scanning electron microscope capable of acquiring all available information from any type of sample. It is a true "all-in-one" instrument, particularly well-suited for structural analysis and task automation. This represents the second generation of Quanta FEG systems, featuring improved image resolution and contrast, as well as an optional new imaging system that can be operated remotely
It is supplied with a field emission gun, it is capable to operate in both high vacuum (HV ; (P<6.10-4 Pa)) and low vacuum (LV ; P = 10 to 130 Pa) conditions as well as environmental SEM (ESEM ; P = 10 to 2700 Pa with water vapour).
ESEM capability allows imaging of non-conductive, hydrated, biological, or contaminated samples without extensive preparation.
Instrument characteristics:
• Field emission gun
• Spatial Resolution: 15 kV: 2.1 nm, 1 kV: 5 nm
• Operating voltage: 0.5-30 kV
• Probe current: < 100 nA
The instrument is equipped with:
• Secondary Electron (SE) detector
• Backscattered Electron (BSE) detector
• Energy Dispersive X-ray Spectroscopy (EDS/EDX) system for elemental analysis (GENESIS XM 4i with Si(Li) type detector (Super Ultra Thin Window) from EDAX and 10 litres liquid nitrogen dewar
• Large specimen chamber and motorized stage
• Peltier stage (-20°C - +100°C)
• Heating stage (1500°C)
Also included
• 2 Computers – 3 screens
• Power transformer
• Control table
• Pumping system (Turbo molecular pumps (x2) and rotary pump in the main chamber + ionic pumps (x2) for the electrons column)
• Cd Rom (FEI & EDAX)
• User Manuals
A preventive maintenance was annually carried out by FEI service engineers.
The FEG tip was replaced in April 2026.
System available in September 2026.
Please note that this description may have been translated or optimized with artificial intelligence (AI) automatically. The information of this classified ad are only indicative. We recommend to check the details with the seller before a purchase.
Is installation, services, or warranties included with this equipment?
This equipment has no installation, services, or warranties included.
What type of instrument is this FEI Quanta 200FEG-ESEM?
This FEI Quanta 200FEG-ESEM is a scanning electron microscope.
When was this FEI Quanta 200FEG-ESEM manufactured?
This FEI Quanta 200FEG-ESEM was manufactured in 2007.
The following questions and answers are generated using artificial intelligence based on the product information available. They are provided for guidance only and may not reflect all specifications or conditions. Please contact us if you need precise or confirmed details.
THERMOFISHER Quanta200 FEG-ESEM (manufactured 2007)
Overview
The Quanta 200 FEG-ESEM is a field-emission scanning electron microscope with environmental SEM capability designed for structural analysis and automated tasks across a wide range of sample types, including non-conductive, hydrated, biological, or contaminated specimens without extensive preparation. The system supports high vacuum, low vacuum and environmental SEM modes and includes a field emission gun (FEG).
Key instrument specifications (as supplied)
- Field emission gun (FEG)
- Operating voltage: 0.5–30 kV
- Spatial resolution: 15 kV: 2.1 nm; 1 kV: 5 nm
- Probe current: <100 nA
- Vacuum/ESEM ranges cited in supplied information for HV, LV and ESEM operation
Included detectors and analysis
- Secondary Electron (SE) detector
- Backscattered Electron (BSE) detector
- Energy Dispersive X-ray Spectroscopy (EDS/EDX): GENESIS XM 4i with Si(Li) type detector (EDAX) and a 10-litre liquid nitrogen dewar
Chambers, stages and sample handling
- Large specimen chamber with motorized stage
- Peltier stage (-20 °C to +100 °C)
- High-temperature heating stage (1500 °C)
Accessories, controls and support equipment
- Two computers driving three display screens
- Control table with keyboard, mouse and a multi-knob control pendant
- Power transformer
- Pumping system as supplied (turbo molecular pumps x2 and a rotary pump for the main chamber; ionic pumps x2 for the electron column)
- CD-ROMs (FEI & EDAX) and user manuals
Maintenance and availability
- Preventive maintenance reportedly carried out annually by FEI service engineers
- FEG tip replacement reported in April 2026
- System listed as available in September 2026
Condition and visible items
- EDAX EDS detector canister is mounted to the column
- Dual monitor workstation is present; screens display spectral and SEM image windows
- Control pendant with multiple knobs, keyboard and mouse are included at the operator desk
- Multiple computer towers and electronics are present under the desk and adjacent to the cabinet; extensive cabling is routed to the rear and floor (cable routing appears congested)
- Large instrument cabinet shows a green illuminated indicator light; exterior exhibits minor scuffs but no obvious major damage
- Monitors and control electronics appear powered on
Notes and limitations
All technical details and accessory lists above are taken from the supplied equipment description and the listed visual items. No claims are made regarding operational testing, current performance, or warranty unless explicitly provided in the supplied information.
The following description has been generated using artificial intelligence based on the product information available. It is provided for guidance only and may not reflect all specifications or conditions. Please contact us if you need precise or confirmed details.
| Client type | Factory – large company |
| Active since | 2026 |
| Offers online | 1 |
| Last activity | Sept. 4, 2026 |
Сканиращ електронен микроскоп: FEI Quanta 200FEG-ESEM
Rastrovací elektronový mikroskop: FEI Quanta 200FEG-ESEM
Scanningelektronmikroskop: FEI Quanta 200FEG-ESEM
Rasterelektronenmikroskop: FEI Quanta 200FEG-ESEM
Ηλεκτρονικό μικροσκόπιο σάρωσης: FEI Quanta 200FEG-ESEM
Scanning Electron Microscope: FEI Quanta 200FEG-ESEM
Microscopio electrónico de barrido: FEI Quanta 200FEG-ESEM
Microscope électronique à balayage : FEI Quanta 200FEG-ESEM
Skener elektronski mikroskop: FEI Quanta 200FEG-ESEM
Pásztázó elektronmikroszkóp: FEI Quanta 200FEG-ESEM
Microscopio elettronico a scansione: FEI Quanta 200FEG-ESEM
Skanuojantis elektroninis mikroskopas: FEI Quanta 200FEG-ESEM
Scanning-elektronenmicroscoop: FEI Quanta 200FEG-ESEM
Mikroskop elektronowy skaningowy: FEI Quanta 200FEG-ESEM
Microscópio Eletrónico de Varrimento: FEI Quanta 200FEG-ESEM
Microscop electronic de baleiaj: FEI Quanta 200FEG-ESEM
Сканирующий электронный микроскоп: FEI Quanta 200FEG-ESEM
Skenirajući elektronski mikroskop: FEI Quanta 200FEG-ESEM
Svepelektronmikroskop: FEI Quanta 200FEG-ESEM
Taramalı Elektron Mikroskobu: FEI Quanta 200FEG-ESEM
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